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Monday, August 17, 2020 | History

3 edition of Modeling of optical thin films found in the catalog.

Modeling of optical thin films

Modeling of optical thin films

20-21 August 1987, San Diego, California

  • 116 Want to read
  • 29 Currently reading

Published by SPIE--the International Society for Optical Engineering in Bellingham, Wash., USA .
Written in English

    Subjects:
  • Optical coatings -- Mathematical models -- Congresses.,
  • Thin films -- Mathematical models -- Congresses.

  • Edition Notes

    Includes bibliographies and index.

    StatementMichael Ray Jacobson, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... [et al.].
    SeriesProceedings of SPIE--the International Society for Optical Engineering ;, v. 821
    ContributionsJacobson, Michael Ray., Society of Photo-optical Instrumentation Engineers., New Mexico State University. Applied Optics Laboratory.
    Classifications
    LC ClassificationsTS517.2 .M63 1988
    The Physical Object
    Paginationvi, 233 p. :
    Number of Pages233
    ID Numbers
    Open LibraryOL2411951M
    ISBN 100892528567
    LC Control Number87062554

    Characterizing Optical Thin Films (I) Physical vapor deposition is the most common technique used to deposit optical thin films for a large variety of applications. This requires the ability to get a solid material into a vapor (gaseous) form, to transport it to a surface onto which the film is to be. Get this from a library! Modeling of optical thin films II: July, , San Diego, California. [Michael Ray Jacobson; Society of Photo-optical Instrumentation Engineers.;].

    Olaya, ), low-friction thin films (Heimberg et al., ) corrosion-resistant thin films (Flores et al., ), and thin films used as a protective optical system (Stefan et al., ), as well as maybe the most interesting applications, thin films used in the electronic industry (Monroy et al., ). Spectroscopic Ellipsometry (SE) is sensitive to many parameters of interest to thin-film science, such as • Film thickness • Interfaces • Optical functions (n and k). But SE data is not meaningful by itself. Therefore One must model the near-surface region to get useful Size: KB.

    Version of OptiLayer Thin Film Software released on October 6, (Registered users only). Hot-fix version e released on February 9, Track records of the new features of this release are here. ve (32 bit) ve (64 bit) European OptiLayer Workshop will be held on April in Hotel Terrassenhof am Tegernsee. the four hour lecture "Physics and Technology of Thin Films" was devided into two two hour lectures, "Thin Film Technology", LVA and "Physics of Thin Films", LVA Together, both lectures comprise the topics of the present script. Within the script the contents of the two lectures are cab be distibguished by different Size: KB.


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Modeling of optical thin films: AugustSan Diego, California. [Michael Ray Jacobson; Society of Photo-optical Instrumentation Engineers.; New Mexico State University. Applied Optics Laboratory.;]. Optical and electrical modeling of thin-film silicon solar cells - Volume 23 Issue 4 - M.

Zeman, J. Krc Skip to main content Accessibility help We use cookies to distinguish you from other users and to provide you with a better experience on our by: